Degradation of semiconductor devices shortens the life of electronics and multiplies electronic waste, not to mention the constant need to buy new or repair old ones. One of the problems in this regard is the question of the rapid degradation of electronic devices based on ferroelectric materials. Scientists from Australia have made a discovery that promises to help extend the life of such materials and electronic devices based on them.
Ferroelectric materials are used in many devices, including storage devices, capacitors, actuators, and sensors. All of these can be found in both consumer and industrial devices such as computers, medical ultrasound equipment, underwater sonars and much more. Researchers at the University of Sydney have made an important discovery in the field of materials science by providing for the first time a complete picture of how fatigue occurs in ferroelectric materials.
A special stand with an electron microscope helped the scientists make the discovery. The essence of the experiment was to follow the emergence and development of the effect of “ferroelectric fatigue” in real time at the atomic level and directly on the operating device. The experiment was completely successful, as the researchers reported in the article “Direct observation of the nanoscale dynamics of degradation of ferroelectrics” on the Nature Communications portal.
“Our discovery is a significant scientific breakthrough as it provides a clear picture of how the degradation process of ferroelectrics is present at the nanoscale.” – said the co-author of the work, Professor Xiaozhou Liao (Xiaozhou Liao).
“While it has long been known that ferroelectric fatigue can shorten the life of electronic devices, how it occurs has not previously been well understood due to the lack of suitable technology to observe it,” – confirmed the lead researcher of the study, Dr. Qianwei Huang (Qianwei Huang).
Scientists are ready to transfer observational data to electronics manufacturers so that they can adjust the manufacturing processes of electronic devices based on ferroelectrics. It is hoped that a complete understanding of the processes that take place at the atomic level will help make devices more reliable and more durable.
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